TCAD-Based Investigation of a V H-SiC Trench …
Apr · CV of H-SiC MOS capacitor before (red curve) and after (blue curve) a post-oxidation anneal in NO The gray curve represents a simulation without defects at the interface Close modal The voltage sweep rate and direction can be varied to probe NIOT type defects NIOTs with a slow time constant may cause a hysteresis of the CV as the …